Beyond Semiconductor
Beyond JTAG TAP (Test Access Port) Controller


TAP Controllers provide access to internal test and diagnostic structures via standardized serial interface. Beyond TAP Controller is designed according to IEEE 1149.1-2001 standard and is very useful for applications which require fine control over TAP insertion or use test and diagnostic features in functional modes of operation. Full RTL delivery and parameterized design allow easy integration and pre-synthesis verification of TAP and corresponding functional mode test and diagnostic features. TAP Controller has been implemented in various designs, integrated into functional RTL and re-used by EDA tools that inserted MBIST, LBIST and Boundary Scan logic automatically.
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TAP Interface
  • IEEE 1149.1-2001 compliant state machine
  • Parameterized Instruction Register length
  • Parameterized Instruction Set
  • Mandatory BYPASS instruction implemented transparently to the user/integrator
  • Optional IDCODE instruction implemented transparently to the user/integrator and selected at compile time
  • Optional USERCODE instruction implemented transparently to the user/integrator and selected at compile time
 
 
 
Internal Interface
  • Instruction decoder output vector
  • TAP state information signals
  • Single serial data output
  • Vector of serial data inputs, one per instruction, internally multiplexed depending on instruction register value
 
 
 
   
   


 


Beyond JTAG TAP (Test Access Port) Controller


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